OPA817DTKR

Texas Instruments
595-OPA817DTKR
OPA817DTKR

Mfr.:

Description:
Operational Amplifiers - Op Amps 800-MHz high-precis ion unity-gain-stabl

ECAD Model:
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In Stock: 2 088

Stock:
2 088 Can Dispatch Immediately
Factory Lead Time:
6 Weeks Estimated factory production time for quantities greater than shown.
Minimum: 1   Multiples: 1
Unit Price:
-,-- €
Ext. Price:
-,-- €
Est. Tariff:
Packaging:
Full Reel (Order in multiples of 3000)

Pricing (EUR)

Qty. Unit Price
Ext. Price
Cut Tape / MouseReel™
7,17 € 7,17 €
5,57 € 55,70 €
5,17 € 129,25 €
4,72 € 472,00 €
4,52 € 1 130,00 €
4,39 € 2 195,00 €
4,28 € 4 280,00 €
Full Reel (Order in multiples of 3000)
4,15 € 12 450,00 €
† A MouseReel™ fee of 5,00 € will be added and calculated in your basket. All MouseReel™ orders are non-cancellable and non-returnable.

Product Attribute Attribute Value Select Attribute
Texas Instruments
Product Category: Operational Amplifiers - Op Amps
RoHS:  
1 Channel
400 MHz
1 kV/us
50 uV
2 pA
12.6 V
6 V
10 mA
30 mA
84 dB
WSON-8
SMD/SMT
Shutdown
- 40 C
+ 105 C
OPA817
Reel
Cut Tape
MouseReel
Brand: Texas Instruments
Gain V/V: 1 V/V
Input Type: Differential
Ios - Input Offset Current: 1 pA
Moisture Sensitive: Yes
Product: Operational Amplifiers
Product Type: Op Amps - Operational Amplifiers
PSRR - Power Supply Rejection Ratio: 100 dB
Factory Pack Quantity: 3000
Subcategory: Amplifier ICs
Topology: Boost
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CNHTS:
8542339000
CAHTS:
8542330000
USHTS:
8542330001
MXHTS:
8542330299
ECCN:
EAR99

OPA817 High Precision Operational Amplifier

Texas Instruments OPA817 High Precision Operational Amplifier (Op Amp) is a unity-gain stable voltage-feedback operational amplifier for high-speed, high-precision, and wide-dynamic range applications. The OPA817 has a low-noise junction gate field-effect transistor (JFET) input stage with a wide gain bandwidth of 400MHz and a supply range from 6V to 12.6V. The fast slew rate of 1000V/µs allows a low distortion and wide large-signal bandwidth when used as a high-impedance buffer in high-speed digitizers, active probes, and other test and measurement applications.